OMT Metrology Application Engineer

As a Metrology Application Engineer at Micron, you will learn how to use innovative Metrology recipe and equipment to solve issues, accelerating cycles of learning and technology transfer in Technology Development. Develop critical thinking and problem-solving skills for beneficial Metrology applications. Improve process reliability, support experimentation, data analysis, and process improvement in Technical Development or equivalent experience.

Requirements

• Develop, analyze and implement metrology measurement techniques in Photo Lithography or Film Metrology, including Overlay, CD-SEM, OCD scatterometry, X-ray and surface analysis platforms.
• Perform SWR (Special Work Request) and conversion plan to validate the Metrology recipe setup for new process change, advanced tool qualification and Engineering evaluations.
• Be responsible for NPI (New Product Introduction) transfer, defining quality metrics, achieving metrology reliability, and driving the cross-site matching performance.
• Collaborate consistently with fab operation and equipment team to improve the fab pillars in terms of quality, cost, capacity, and cycle time.
• Provide reliable and valuable metrology applications to enhance Micron's technical competitiveness and working methods and promote the growth of the metrology team.
• Drive the understanding of new metrology technology and measurement techniques to ensure that our measurement capabilities meet the technical roadmap.
• Evaluate continuous improvement program through vendor engagement and cross-functional teamwork with internal team.
• Engage with the global network to develop best-known methods and maintain alignment between Fab sites.